英国工程技术学会
期刊
会议
图书
作者:Xuandong Liu , Ming Chen , Chengjun Liang ...
来源:[J].IET Science, Measurement & Technology, 2020, Vol.14 (2), pp.188-197IET
摘要:Compared to bushings with lower voltage levels, the ±1100 kV converter valve-side bushing has thicker radial insulation and longer axial insulation resulting in a more uneven temperature distribution and more severe electric field distortion, especially under high-ambient-te...
作者:Majid Moradi Zirkohi
来源:[J].IET Science, Measurement & Technology, 2020, Vol.14 (2), pp.182-187IET
摘要:This study discusses stability analysis of the brain emotional learning-based intelligent controller (BELBIC) for model-free tracking control of a class of uncertain non-linear systems. Due to the unique adaptation laws for the controller gains, stability analysis of these contro...
作者:Rengaraj Madavan , Subbaraj Saroja
来源:[J].IET Science, Measurement & Technology, 2020, Vol.14 (2), pp.137-145IET
摘要:The evaluation and selection of state of transformers based on their mineral oil data are quite difficult. In this study, analytical hierarchy process (AHP) and technique for order preference by similarity to ideal solutions (TOPSISs) are used as the multi-criteria decision suppo...
作者:Luiz A. Zanlorensi , Diego Rafael Lucio , Alceu de Souza Britto Junior ...
来源:[J].IET Biometrics, 2020, Vol.9 (2), pp.68-77IET
摘要:One of the major challenges in ocular biometrics is the cross-spectral scenario, i.e. how to match images acquired in different wavelengths. This study designs and extensively evaluates cross-spectral ocular verification methods using well known deep learning representations...
作者:Shaik Subhani , Gampa V.P. Chandra Sekhar Yadav , Venkata Subbarao Ghali
来源:[J].IET Science, Measurement & Technology, 2020, Vol.14 (2), pp.165-172IET
摘要:Quantitative depth estimation, along with enhanced defect detectability, is of utmost importance for subsurface analysis in thermal wave imaging for a variety of applications. However, the size and the depth of the subsurface anomalies influence this quantitative analysis due to ...
作者:Naresh Chillu , Rengaswamy Jayaganthan , Burjupati Nageshwar Rao ...
来源:[J].IET Science, Measurement & Technology, 2020, Vol.14 (2), pp.146-156IET
摘要:Optimised quantity of nano-aluminium (Al) filler mixed with epoxy resin using percolation threshold criteria was adapted to fabricate nanocomposite with desired space-charge and charge-trap properties. Surface potential variation due to charge deposition on to the insulating...
作者:Giovanni Lucca
来源:[J].IET Science, Measurement & Technology, 2020, Vol.14 (2), pp.225-232IET
摘要:The study generalises the calculation method described by Lucca, devoted to the evaluation of induced voltage and current on a pipeline due to a nearby overhead power line in a fault condition, from the case of homogeneous soil to the case of a two-layer soil. By means of some ex...
作者:Alireza Sepas-Moghaddam , Fernando M. Pereira , Paulo Lobato Correia
来源:[J].IET Biometrics, 2020, Vol.9 (2), pp.58-67IET
摘要:In a world where security issues have been gaining growing importance, face recognition systems have attracted increasing attention in multiple application areas, ranging from forensics and surveillance to commerce and entertainment. To help to understand the landscape and abstra...
作者:Dyhia Doufene , Slimane Bouazabia , Abderrahmane Haddad
来源:[J].IET Science, Measurement & Technology, 2020, Vol.14 (2), pp.198-205IET
摘要:In this study, a particle swarm optimisation (PSO) algorithm coupled with finite-element method (FEM) is implemented to improve the performance of a cap-and-pin insulator by reducing the value of maximum electric field strength. Two goals are set in this work: (i) optimisation of...
作者:Rapaka Satish , P. Rajesh Kumar
来源:[J].IET Biometrics, 2020, Vol.9 (2), pp.78-90IET
摘要:Segmentation of the iris is a crucial stage in an automated iris-based recognition system. The performance of any biometric system primarily relies on how effectively the iris is extracted from the unwanted parts of an iris image. The process of iris segmentation is mainly affect...

我们正在为您处理中,这可能需要一些时间,请稍等。

资源合作:cnki.scholar@cnki.net, +86-10-82896619   意见反馈:scholar@cnki.net

×